Approved Work Item
ISO/AWI 17470
Microbeam analysis — Electron probe microanalysis — Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
Reference number
ISO/AWI 17470
Edition 3
© ISO 2025
Approved Work Item
Under development
A working group has prepared a draft.
Will replace ISO 17470:2014

Abstract

ISO 17470:2014 gives guidance for the identification of elements and the investigation of the presence of specific elements within a specific volume (on a μm3 scale) contained in a specimen, by analysing X-ray spectra obtained using wavelength dispersive X-ray spectrometers on an electron probe microanalyser or on a scanning electron microscope.

General information

  • Status
     : Under development
    Stage
    : New project registered in TC/SC work programme [20.00]
  • Edition
     : 3
  • Technical Committee :
    ISO/TC 202/SC 2
  • RSS updates

Life cycle

Got a question?

Check out our Help and Support

  2. Store
  3. Standards catalogue
  4. TC
  5. ISO/TC 202/SC 2
  6. ISO/AWI 17470