ISO/TR 15969:2001

Retirada (Edición 1, 2001)

Nueva versión disponible: ISO/TR 15969:2021

Resumen

This Technical Report gives guidelines for measuring the sputtered depth in sputtered depth profiling. The methods

of sputtered depth measurement described in this Technical Report are applicable to techniques of surface

chemical analysis when used in combination with ion bombardment for the removal of a part of a solid sample to a

typical sputtered depth of up to severalmicrometres.

Check out our FAQs

Customer care

+41 22 749 08 88

Opening hours:
Monday to Friday - 09:00-12:00, 14:00-17:00 (UTC+1)