Approved Work Item
ISO/AWI 25797
Fine ceramics (advanced ceramics, advanced technical ceramics) --Test method for determining amount-of-substance of deposited materials and physical film thickness by using X-ray fluorescence spectrometry
Reference number
ISO/AWI 25797
Edition 1
Approved Work Item
ISO/AWI 25797
91505
A working group has prepared a draft.

Abstract

This international standard specifies a method of X-ray fluorescence (XRF) spectrometry for measuring amount-of-substance of deposited materials which can derive film thickness or relative film density of fine ceramic coatings or metal films on a substrate.

General information

  •  : Under development
    : New project registered in TC/SC work programme [20.00]
  •  : 1
  • ISO/TC 206
  • RSS updates

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