Abstract
ISO 11505:2013 describes a glow discharge optical emission spectrometric (GD-OES) method for the determination of the thickness, mass per unit area and chemical composition of surface layer films.
It is limited to a description of general procedures of quantification of GD-OES and is not applicable directly for the quantification of individual materials having various thicknesses and elements to be determined.
General information
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Status: Under developmentStage: Committee draft (CD) registered [30.00]
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Edition: 2
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Technical Committee :ISO/TC 201/SC 8
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Life cycle
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Previously
PublishedISO 11505:2012
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Now
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