ISO 13067:2020

Published (Edition 2, 2020)

ISO 13067:2020

CHF 129

Convert Swiss francs (CHF) to your currency

Abstract

This document describes procedures for measuring average grain size derived from a two-dimensional polished cross-section using electron backscatter diffraction (EBSD). This requires the measurement of orientation, misorientation and pattern quality factor as a function of position in the crystalline specimen^[¹^]. The measurements in this document are made on two dimensional sections. The reader should note carefully the definitions used (3.3) which draw a distinction between the measured sectional grain sizes, and the mean grain size which can be derived from them that relates to the three dimensional grain size.

NOTE 1 While conventional methods for grain size determination using optical microscopy are well-established, EBSD methods offer a number of advantages over these techniques, including increased spatial resolution and quantitative description of the orientation of the grains.

NOTE 2 The method also lends itself to the measurement of the grain size of complex materials, for example those with a significant duplex content.

NOTE 3 The reader is warned to interpret the results with care when attempting to investigate specimens with high levels of deformation.

General information

Status
: Published

Publication date
: 2020-07

Stage
: International Standard to be revised [90.92]
Edition
: 2

Number of pages
: 26
Technical Committee :
ISO/TC 202

ICS :
71.040.50
RSS updates