ISO 20263:2017
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ISO 20263:2017
67438

Abstract  Preview

ISO 20263:2017 specifies a procedure for the determination of averaged interface position between two different layered materials recorded in the cross-sectional image of the multi-layered materials. It is not intended to determine the simulated interface of the multi-layered materials expected through the multi-slice simulation (MSS) method. This document is applicable to the cross-sectional images of the multi-layered materials recorded by using a transmission electron microscope (TEM) or a scanning transmission electron microscope (STEM) and the cross-sectional elemental mapping images by using an energy dispersive X-ray spectrometer (EDS) or an electron energy loss spectrometer (EELS). This document is also applicable to the digitized image recorded on an image sensor built into a digital camera, a digital memory set in the PC or an imaging plate and the digitalized image converted from an analogue image recorded on the photographic film by an image scanner.


General information 

  •  :  Published
     : 2017-11
  •  : 1
     : 45
  •  : ISO/TC 202/SC 3 Analytical electron microscopy
  •  :
    37.020 Optical equipment
    71.040.50 Physicochemical methods of analysis

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