Abstract
ISO 23833:2013 defines terms used in the practices of electron probe microanalysis (EPMA). It covers both general and specific concepts classified according to their hierarchy in a systematic order.
ISO 23833:2013 is applicable to all standardization documents relevant to the practices of EPMA. In addition, some parts of ISO 23833:2013 are applicable to those documents relevant to the practices of related fields (SEM, AEM, EDX, etc.) for definition of those terms common to them.
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General information
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Status: PublishedPublication date: 2013-04Stage: Close of review [90.60]
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Edition: 2Number of pages: 27
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Technical Committee :ISO/TC 202/SC 1
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Life cycle
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Previously
WithdrawnISO 23833:2006
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Now
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