ISO 16526-1:2011

Published (Edition 1, 2011)

This standard was last reviewed and confirmed in 2021. Therefore this version remains current.

ISO 16526-1:2011

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Abstract

ISO 16526-1:2011 specifies a method for the direct and absolute measurement of the average high voltage of constant potential (DC) X-ray systems on the secondary side of the high voltage generator. The intention is to check the correspondence with the indicated high voltage value on the control unit of the X-ray system.

This method is applied to assure a reproducible operation of X-ray systems because the voltage influences particularly the penetration of materials and the contrast of X-ray images and also the requirements concerning the radiation protection.

General information

Status
: Published

Publication date
: 2011-12

Stage
: International Standard confirmed [90.93]
Edition
: 1

Number of pages
: 2
Technical Committee :
ISO/TC 135/SC 5

ICS :
19.100
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