ISO 29301:2010
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ISO 29301:2010
45399

Abstract

ISO 29301:2010 specifies a calibration procedure applicable to images recorded over a wide magnification range in a transmission electron microscope (TEM). The reference materials used for calibration possess a periodic structure, such as a diffraction grating replica, a super-lattice structure of semiconductor or an analysing crystal for X-ray analysis, and a crystal lattice image of carbon, gold or silicon. ISO 29301:2010 is applicable to the magnification of the TEM image recorded on a photographic film, or an imaging plate, or detected by an image sensor built into a digital camera. ISO 29301:2010 also refers to the calibration of a scale bar. ISO 29301:2010 does not apply to the dedicated critical dimension measurement TEM (CD-TEM) and the scanning transmission electron microscope (STEM)


General information 

  •  :  Withdrawn
     : 2010-06
  •  : 1
     : 40
  •  : ISO/TC 202/SC 3 Analytical electron microscopy
  •  :
    37.020 Optical equipment

Life cycle


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