Reference number
ISO 17470:2004
© ISO 2025
ISO 17470:2004
Microbeam analysis — Electron probe microanalysis — Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
Edition 1
2004-09
Withdrawn
Withdrawn (Edition 1, 2004)

Abstract

ISO 17470:2004 gives guidance for the identification of elements and the investigation of the presence of specific elements, within a specific volume, contained in a specimen, by analysing X-ray spectra obtained using wavelength dispersive X-ray spectrometers on an electron probe microanalyser or on a scanning electron microscope.

General information

  • Status
     : Withdrawn
    Publication date
     : 2004-09
    Stage
    : Withdrawal of International Standard [95.99]
  • Edition
     : 1
    Number of pages
     : 10
  • Technical Committee :
    ISO/TC 202/SC 2
    ICS :
    71.040.99 
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