This standard has been revised by ISO 17470:2014
Abstract
ISO 17470:2004 gives guidance for the identification of elements and the investigation of the presence of specific elements, within a specific volume, contained in a specimen, by analysing X-ray spectra obtained using wavelength dispersive X-ray spectrometers on an electron probe microanalyser or on a scanning electron microscope.
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Status: WithdrawnPublication date: 2004-09
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Edition: 1Number of pages: 10
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- ICS :
- 71.040.99 Other standards related to analytical chemistry
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