Reference number
ISO 17915:2018
© ISO 2024
International Standard
ISO 17915:2018
Optics and photonics — Measurement method of semiconductor lasers for sensing
Edition 1
2018-05
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Published (Edition 1, 2018)
This publication was last reviewed and confirmed in 2023. Therefore this version remains current.

ISO 17915:2018

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CHF 151
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Abstract

This document describes methods of measuring temperature and injected current dependence of lasing wavelengths, and lasing spectral line width in relation to semiconductor lasers for sensing applications.

This document is applicable to all kinds of semiconductor lasers, such as edge-emitting type and vertical cavity surface emitting type lasers, bulk-type and (strained) quantum well lasers, and quantum cascade lasers, used for optical sensing in e.g. industrial, medical and agricultural fields.

General information

  • Status
     : Published
    Publication date
     : 2018-05
    Stage
    : International Standard confirmed [90.93]
  • Edition
     : 1
    Number of pages
     : 29
  • Technical Committee :
    ISO/TC 172/SC 9
    ICS :
    31.260 
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Life cycle

Sustainable Development Goals

This standard contributes to the following Sustainable Development Goal

9
Industry, Innovation and Infrastructure

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