Reference number
ISO 29301:2023
© ISO 2024
International Standard
ISO 29301:2023
Microbeam analysis — Analytical electron microscopy — Methods for calibrating image magnification by using reference materials with periodic structures
Edition 3
2023-10
Preview
No disponible en español
Publicado (Edición 3, 2023)

ISO 29301:2023

Idioma
Formato
CHF 173
Convertir Franco suizo (CHF) a tu moneda

Resumen

This document specifies a calibration procedure applicable to images recorded over a wide magnification range in a transmission electron microscope (TEM). The reference materials used for calibration possess a periodic structure, such as a diffraction grating replica, a super-lattice structure of semiconductor or an analysing crystal for X-ray analysis, and a crystal lattice image of carbon, gold or silicon.

This document is applicable to the magnification of the TEM image recorded on a photographic film, or an imaging plate, or detected by an image sensor built into a digital camera. This document also refers to the calibration of a scale bar.

This document does not apply to the dedicated critical dimension measurement TEM (CD-TEM) and the scanning transmission electron microscope (STEM).

Informaciones generales

  • Estado
     : Publicado
    Fecha de publicación
     : 2023-10
    Etapa
    : Norma Internacional publicada [60.60]
  • Edición
     : 3
    Número de páginas
     : 44
  • Comité Técnico :
    ISO/TC 202/SC 3
    ICS :
    37.020 
  • RSS actualizaciones

Ciclo de vida

Objetivos de Desarrollo Sostenible

Esta norma contribuye al siguiente Objetivo de Desarrollo Sostenible

9
Industry, Innovation and Infrastructure

¿Tiene alguna duda?

Consulte nuestras Ayuda y asistencia

  2. Tienda
  3. Standards catalogue
  4. ICS
  5. 37
  6. 37.020
  7. ISO 29301:2023