Resumen
This document specifies the substrate conditions and testing of the modulation period (including the principles for low-angle X-ray methods, the requirements of the coatings, the requirements for X-ray measuring apparatus, the calibration of apparatus and samples, and the testing conditions and calculation process) of nano-multilayer coatings by low-angle X-ray methods including X-ray reflectivity (XRR) and glancing incident X-ray diffraction (GIXRD).
Informaciones generales
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Estado: PublicadoFecha de publicación: 2022-07Etapa: Norma Internacional publicada [60.60]
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Edición: 1Número de páginas: 8
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Comité Técnico :ISO/TC 107/SC 9ICS :25.220.01
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