Reference number
ISO 16526-1:2011
ISO 16526-1:2011
© ISO 2024
International Standard
ISO 16526-1:2011
Non-destructive testing — Measurement and evaluation of the X-ray tube voltage — Part 1: Voltage divider method
Edition 1
2011-12
2011-12
ISO 16526-1:2011
57042
Publicado
(Edición 1, 2011)
Esta publicación se revisó y confirmó por última vez en 2021.
Por lo tanto, esta versión es la actual.
Resumen
ISO 16526-1:2011 specifies a method for the direct and absolute measurement of the average high voltage of constant potential (DC) X-ray systems on the secondary side of the high voltage generator. The intention is to check the correspondence with the indicated high voltage value on the control unit of the X-ray system.
This method is applied to assure a reproducible operation of X-ray systems because the voltage influences particularly the penetration of materials and the contrast of X-ray images and also the requirements concerning the radiation protection.
Informaciones generales
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Estado: PublicadoFecha de publicación: 2011-12Etapa: Norma Internacional confirmada [90.93]
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Edición: 1Número de páginas: 2
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Comité Técnico :ISO/TC 135/SC 5ICS :19.100
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