ISO/TS 25138:2010
Surface chemical analysis — Analysis of metal oxide films by glow-discharge optical-emission spectrometry
Reference number
ISO/TS 25138:2010
Edición 1
2010-12
© ISO 2024
Retirada
Retirada (Edición 1, 2010)

Resumen

ISO/TS 25138:2010 describes a glow-discharge optical-emission spectrometric method for the determination of the thickness, mass per unit area and chemical composition of metal oxide films.

The method is applicable to oxide films 1 nm to 10 000 nm thick on metals. The metallic elements of the oxide can include one or more from Fe, Cr, Ni, Cu, Ti, Si, Mo, Zn, Mg, Mn and Al. Other elements that can be determined by the method are O, C, N, H, P and S.

Informaciones generales

  • Estado
     : Retirada
    Fecha de publicación
     : 2010-12
    Etapa
    : Retirada de la Norma Internacional [95.99]
  • Edición
     : 1
    Número de páginas
     : 36
  • Comité Técnico :
    ISO/TC 201/SC 8
    ICS :
    71.040.40 
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