Resumen
Establishes a reference system incorporating all calibrated motions of rotation and displacement on the microscope and its accessories so that the measuring procedures are uniform. Particular attention is given to the polarization parameters and measuring accessories.
Informaciones generales
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Estado: PublicadoFecha de publicación: 1996-12Etapa: Norma Internacional confirmada [90.93]
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Edición: 1Número de páginas: 6
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Comité Técnico :ISO/TC 172/SC 5ICS :37.020
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