ISO 17915:2018

Status : Published (Under review)

This standard was last reviewed and confirmed in 2023. Therefore this version remains current.

	Format	Language
std 1 145	PDF + ePub
std 2 145	Paper

CHF145

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Abstract

This document describes methods of measuring temperature and injected current dependence of lasing wavelengths, and lasing spectral line width in relation to semiconductor lasers for sensing applications.

This document is applicable to all kinds of semiconductor lasers, such as edge-emitting type and vertical cavity surface emitting type lasers, bulk-type and (strained) quantum well lasers, and quantum cascade lasers, used for optical sensing in e.g. industrial, medical and agricultural fields.

General information

Status
: Published

Publication date
: 2018-05

Stage
: International Standard confirmed [90.93]
Edition
: 1

Number of pages
: 29
Technical Committee :
ISO/TC 172/SC 9

ICS :
31.260
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