ISO 17915:2018
p
ISO 17915:2018
72946
Status : Published (Under review)
This standard was last reviewed and confirmed in 2023. Therefore this version remains current.
en
Format Language
std 1 145 PDF + ePub
std 2 145 Paper
  • CHF145
Convert Swiss francs (CHF) to your currency

Abstract

This document describes methods of measuring temperature and injected current dependence of lasing wavelengths, and lasing spectral line width in relation to semiconductor lasers for sensing applications.

This document is applicable to all kinds of semiconductor lasers, such as edge-emitting type and vertical cavity surface emitting type lasers, bulk-type and (strained) quantum well lasers, and quantum cascade lasers, used for optical sensing in e.g. industrial, medical and agricultural fields.

General information

  •  : Published
     : 2018-05
    : International Standard confirmed [90.93]
  •  : 1
     : 29
  • ISO/TC 172/SC 9
    31.260 
  • RSS updates

Read sample 

Preview this standard in our Online Browsing Plateform (OBP)

Got a question?

Check out our FAQs

Customer care
+41 22 749 08 88

Opening hours:
Monday to Friday - 09:00-12:00, 14:00-17:00 (UTC+1)